Brian Huchel is a Lead Media Relations Specialist at Purdue
How media typically covers Brian Huchel
Brian Huchel as author
Purdue University and Argonne National Laboratory are developing AI-powered X-ray imaging techniques to faster detect microscopic semiconductor chip defects during manufacturing, combining high-resolution imaging with machine learning algorithms for automatic defect detection.
“Author of "Researchers Use AI Imaging to Spot Chip Defects"”